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Test & Measurement
Precision RF components and assemblies for test instruments and characterization systems
Test and measurement instruments place uniquely stringent demands on RF components: high dynamic range, exceptional gain flatness, very low spurious outputs, and long-term calibration stability. ATEK MIDAS supplies custom ICs and integrated microwave assemblies specifically optimized for T&M applications.
Instrument Applications
We supply RF components for vector network analyzers (VNAs), spectrum analyzers, signal generators, noise figure analyzers, power meters, and channel emulators. We also design complete RF front-end assemblies for OTA (over-the-air) test chambers used to characterize 5G and mmWave devices under test.
Key Performance Requirements
T&M applications typically demand extremely flat gain and group delay across wide bandwidths, very low noise figures in receive paths, high IP3 and low harmonic distortion in signal paths, and excellent temperature stability across the full instrument operating range. Our design methodology accounts for all of these at the IC and module level.
RF Test & Measurement Services
Beyond supplying components, ATEK MIDAS also offers RF test and measurement services — S-parameter characterization, noise figure measurement, large-signal and compression testing, phase noise measurement, and IQ imbalance characterization — to support customer design verification and production acceptance programs.
Working With Us
Contact us at info@atekmidas.com to discuss your instrument architecture and the specific RF component or module requirements we can address.